B. K. Tanner (auth.), Charles S. Barrett, John V.'s Advances in X-Ray Analysis: Volume 33 PDF

By B. K. Tanner (auth.), Charles S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, Paul K. Predecki (eds.)

ISBN-10: 1461399963

ISBN-13: 9781461399964

ISBN-10: 146139998X

ISBN-13: 9781461399988

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This depends upon the absorption, the extinction and the defect structure of the specimen. If the specimen is perfect, hence scattering according to dynamical theory, the incident wave intensity is reduced to lie of its value at the surface in a depth equal to the extinction distance 9 • In the symmetric Bragg case this is proportional to sinBIAF, where A is the wavelength and F the structure factor of the reflection. For an asymmetrical reflection, sinB is replaced by {sin(B-tlplsin(8-tpl}l12 where 4> is the angle between the diffracting plane and the surface.

Growth, 94:392 (1989). F. S. K. Tanner, Proc. S. (1989) in press. M. K. T. G. K. Bowen, J. Appl. , 17:111 (1984). 21 L. R. K. Bowen, this volume. R. H. U. Rek, J. Appl. , 22:70 (1989). K. Y Methods, STRESSES IN THIN FILMS Jerome B. Cohen Department of Materials Science and Engineering Robert R. McCormick School of Engineering and Applied Science The Technological Institute Northwestern University, Evanston, IL 60208 INTRODUCTION While any subject associated with films evokes immediate thoughts about solid-state devices, there are other much more mature areas where it is important, such as coatings, and yet work on this entire subject is only in its infancy.

009 wt. 003 wt. % B. Tensile samples were prepared by cutting longitudinal strips from the tubes and annealing at 704°C for 15 hr. Prior to deformation, the samples were electropolished to remove a thin ground surface layer and any residual oxide layer. The grain size of the material ranged between 10 and 100 ~m. 4% plastic strain. en after which the samples were sectioned by electrospark cutting for the transmission electron-microscopy (TEM) studies. The computer-aided rocking-curve method (CARCA) is based on the double crystal diffractometer in the parallel arrangement (+n, -n).

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Advances in X-Ray Analysis: Volume 33 by B. K. Tanner (auth.), Charles S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, Paul K. Predecki (eds.)

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