By Bruce A. Tuttle, Chonglin Chen, Quanxi Jia, R. Ramesh
Advances in synthesis and characterization of dielectric, piezoelectric and ferroelectric skinny movies are integrated during this quantity. Dielectric, piezoelectric and ferroelectric skinny movies have an incredible effect on quite a few advertisement and armed forces structures together with tunable microwave units, thoughts, MEMS units, actuators and sensors. contemporary paintings on piezoelectric characterization, AFE to FE dielectric section transformation dielectrics, resolution and vapor deposited skinny movies, and fabrics integration are one of the themes incorporated. Novel techniques to nanostructuring, characterization of fabric houses and actual responses on the nanoscale is also included.Content:
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Extra info for Advanced Dielectric, Piezoelectric and Ferroelectric Thin Films, Volume 162
B, 63, 1292 (1993). 4 Q. X. Jia, J. R. Groves, P. Arendt, Y. Fan, A. T. Findikoglu, S. R. Foltyn, H. Jiang, and F. A. Miranda, Appl. Phys. Lett. 74,1564 (1999). -G. , J. Appl. Phys. 93, 504 (2003) 6 Somiya Y, Bhalla AS, Cross LE, INTERNAT. J. INORG. , 3, 709 (2001). 7 Xing XR, Chen J, Deng JX, Liu GR, J. , 360, 286 (2003). 8 K. -H. Hellwege and A. M. Hellwege, "Ferroelectrics and Related Substances," subvolume a: Oxides, in Landolt-Bornstern Numerical Data and Functional Relationships in Science and Technology, edited by K.
Kojima and S. Shimada, "Soft mode spectroscopy of bismuth titanate single crystals," PhysicaB, 219 & 220 617-619 (1996) l2 R. Zallen and M. Slade, "Rigid-layer modes in chalcogenide crystals," Phys. Rev. B, 9  1627-1637(1974) I3 S. Kojima, R. Imaizum, S. Hamazaki, and M. Takashige, "Raman scattering study of bismuth layer-structure ferroelectrics," Jpn. J. Appl. , 33 Part 1 [9B] 5559-5564 (1994) ,4 R. L. T. Ward, "Lattice vibrations and interlayer interactions in crystalline As2S3 and As2Se3," Phys.
3,4,5 However, the issues of which site the excess Bi is incorporated and how excess Bi affects the orientation and polarization of BIT films are still unresolved. To resolve these questions, we investigated the effect of excess Bi on the crystal orientation and lattice dynamics of BIT films by x-ray diffraction (XRD), scanning electron microscopy (SEM) and Raman scattering. 5 The phase development and orientation of the films were studied using XRD &-20 scan. The surface morphology of samples was studied using SEM.
Advanced Dielectric, Piezoelectric and Ferroelectric Thin Films, Volume 162 by Bruce A. Tuttle, Chonglin Chen, Quanxi Jia, R. Ramesh